PENGGUNAAN X-RAY DIFRACTION DAN SOFTWARE PCPDFWIN UNTUK KARAKTERISASI SENYAWA DEPOSIT HASIL PELAPISAN ELECTOLESS NICKEL PHOSPHORUS
DOI:
https://doi.org/10.26905/jtmt.v3i1.4460Keywords:
Electoless Nickel Phosphorus, X-Ray Diffraction, Ni3P, software PCPDFWINAbstract
Salah satu karakterisasi hasil pelapisan Electoless Nickel Phosphorus dilakukan menggunakan X-RayDiffraction (XRD) untuk mengetahui deposit yang terjadi di permukaan logam substrat.Hasil proses Electoless Nickel Phosphorus ini adalah deposit unsur Ni dan P tanpa terjadi difusi sehinggakekerasan yang rendah. Untuk itu perlu dilakukan proses perlakuan panas sehingga difusi dapat terjadiantara Ni dan P yang menghasilkan fasa atau senyawa Ni3P yang merupakan fasa keramik dan bersifatkeras berdasarkan analisa hasil pengujian XRD menggunakan alat bantu software PCPDFWIN.References
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